Shimadzu Fourier Transform Infrared (FTIR) Spectroscopy System

Microscopy System – AIRsight FTIR/Raman

Integrated FTIR + Raman microscopy system
Micro-area analysis (µm scale)
Optical system and camera
IR Mode visible observation
15x Cassegrain reflection objective mirror (45° average incident angle)
15x Cassegrain condenser mirrors (automatic adjusting mechanism)
Raman mode visible observation
50x/0.55 NA Plan objective lens: 20 x 15 um
100x/0.8 NA Plan objective lens: 10 x 7.5 um
Wide-field observation
Up to 10 x 13 mm with 1 to 5x zoom
Auto X-Y stage
Moving range: up to 70 mm (X axis) and 30 mm (Y axis)
1 um resolution (each axis)
Mountable sample thickness:
- Up to 10 mm (transmission measurement)
- Up to 40 mm (reflection or ATR measurement)
Maximum load on stage: 1 kg

Excitation laser
- 532 nm diode-pumped solid-state (DPSS) laser
- 785 nm laser diode
Wavenumber range
- 4,000 – 150 cm-1 (532 nm)
- 3,200 – 150 cm-1 (785 nm)
Wavenumber resolution
- Within 6.0 cm-1 (532 nm)
- Within 4.0 cm-1 (785 nm)
Spatial resolution
- Planar direction:
  - Up to 5 um (50x objective lens)
  - Up to 3 um (100x objective lens)
- Depth direction:
  - Up to 15 um (50x objective lens)
  - Up to 7.5 um (100x objective lens)
CCD detector: 2048 x 264 pixels

IRIS ATR – Diamond crystal (high throughput) – direct solid/liquid measurement and volatiles cover for controlled measurements
EasiDiff DRIFTS accessory – ideal for powders and rough surfaces
VeeMAX III Variable Angle Reflectance Accessory – adjustable angle for thin films and coatings, and surface and layer analysis