Hitachi S4700 Cold-Field Emission Scanning Electron Microscope

Hitachi S4700 Cold-Field Emission Scanning Electron Microscope
Haworth Hall, Room 1043C


Eduardo Rosa-Molinar, Ph.D

Covid Update

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  • Hitachi Scanning Electron Microscope (Model S-4700 Type II)
  • Cold cathode field emission gun
  • Computer-controlled flashing, extraction and accelerating voltage
  • Anode heater
  • Mild flashing function
  • Accelerating voltage 500 V to 30 kV
  • Landing voltage 0.01-2 kV (with deceleration)
  • Magnification 20x to 1,000,000x (referenced to 4”× 5” photo)
  • SE resolution 0.8 nm (15 kV), 1.1 nm (1kV landing voltage)
  • Optical Modes:
    • Normal probe current- optimized for high resolution imaging
    • High probe current- increased beam current, without significant loss of resolution, for analytical techniques
    • Ultra-high resolution- optimized for short working distances
    • High resolution- optimized for long working distances
  • AZtecEnergy Standard Microanalysis System with X-MaxN 80 large area Analytical Silicon Drift Detector (Oxford Instruments)
  • Lower SED for standard topographic imaging
  • Upper through-the-Lens (TTL) SED for high resolution imaging, Top TTL SED, for high resolution imaging with adjustable high pass filter function, In-lens collection system for imaging of low and/or high angle Backscattered Electron (BSE) signals
  • SE/BSE signal selection and mixing for TTL detectors
  • YAG Backscattered Electron (BSE) detector
  • 6” Diameter Specimen Exchange airlock

Workstation Specifications

  • Intel Xeon E3-V3
  • 4GB RAM
  • NVIDIA Quadro K620 graphics card
  • one-1TB SATA HDD
  • Windows 7/ 32-bit