PHI 5000 Versa Probe II

LEEP 2 Room G442

Questions?

Eduardo Rosa-Molinar, Ph.D
Director/Professor
mailab@ku.edu

We kindly ask all MAI staff and visitors to adhere to the latest COVID-19 health and safety guidelines on campus. Thank you for prioritizing everyone's well-being.

Ultra-high vacuum instrument, raster scanned, micro focused, x-ray beam
20 kV electron gun
Floating column argon ion gun
LaB6 emitter- creates a raster-scanned electron beam focused on the Al anode of the x-ray source to produce a monochromated x-rays
Ellipsoidal shaped quartz crystal monochromator- collects, filters, and refocuses x-rays onto the sample surface to scan and acquire the spectrum
Dual-beam charge neutralization
Compucentric Zalar rotation
Sputter depth profiling (5V to 5000)
Angle-resolved spectroscopy
Chemical state imaging
Elemental composition and chemical mapping with SXI (Secondary X-ray Imaging) and Scanning Electron Microscopy (SEM; using secondary electrons)
Five-axis automated sample manipulator
25 mm and 60 mm diameter sample holders
Extra Sample Prep chamber with Heating, Cooling, and mixture of Gases
X-ray beam size for XPS ranges from 9 µ to 200 µ and AES is scanned at 100 nm