Research Resource Core Laboratory

PHI 5000 Versa Probe II

PHI 5000 VERSA PROBE II

LEEP 2 Room G442

Features

  • Scanned, micro-focused, monochromatic x-ray beam
  • Floating column argon ion gun
  • 20 kV electron gun
  • LaB6 emitter creates a raster-scanned electron beam focused on the Al anode of the x-ray source to produce a monochromated x-rays
  • Ellipsoidal shaped quartz crystal monochromator collects, filters, and refocuses x-rays onto the sample surface to scan and acquire the spectrum.
  • Dual-beam charge neutralization
  • Compucentric Zalar rotation
  • Sputter depth profiling (5V to 5000)
  • Angle-resolved spectroscopy
  • Chemical state imaging with 128 data channels
  • Elemental composition and chemical mapping with SXI (Secondary X-ray Imaging) and Scanning Electron Microscopy (SEM; using secondary electrons)
  • Five-axis automated sample manipulator
  • 25 mm and 60 mm diameter sample holders
  • Extra Sample Prep chamber with Heating, Cooling, and mixture of Gases 
  • X-ray beam size for XPS ranges from 9µ to 200µ and AES is scanned at 100nm
  • The instrument is driven by SmartSoft software data are acquired by Multipak Software tools developed by Physical Electronics

Workstation Specifications 

  Work Station

  • Xeon E5-1603
  • 4GB RAM
  • NVIDIA Quadro 410 graphics card
  • two-512GB SATA HDD RAID
  • Windows 7 32 bit.

 

Please contact Dr. Prem S. Thapa Chetri (Senior Electron Microscopist) or Dr. Eduardo Rosa-Molinar (Director/Professor) if you need further details.

 


Dr. Prem S. Thapa Chetri

Senior Electron Microscopist

Questions?

Dr. Eduardo Rosa-Molinar
Director/Professor
erm@ku.edu

Announcements

In observance of the Thanksgiving Holiday, the MAI will be closed Wednesday, November 27th-Friday, November 29th

We will reopen on Monday, December 2nd at 8:30 am. 

We wish you a safe and happy holiday.