Research Resource Core Laboratory

FEI Versa Three-Dimensional (3-D) DualBeam Field Emission/Low Vacuum Scanning Electron Microscope


FEI VERSA THREE-DIMENSIONAL (3-D) DUALBEAM FIELD EMISSION/LOW VACUUM SCANNING ELECTRON MICROSCOPE

Haworth Hall Room 1043D

   Features

  • Field emission gun with 0.1 pA to 200 nA probe current
  • Liquid Gallium Ion source with 0.6 pA to 65 nA probe current
  • 500V to 30kV acceleration Voltage
  • Beam deceleration stage bias -50V to -4kV
  • Magnification 30x to 1280 kx in quad mode
  • High Vacuum, Low Vacuum, and Environmental Scanning Electron Microscopy (ESEM) applications
  • 1.2nm SEM resolution and 0.8nm Scanning/ Transmission Electron Microscopy (S/TEM) resolution at high vacuum mode
  • Everhart-Thornley SE detector (ETD)
  • High-performance Ion Conversion and Electron (ICE) detector
  • InColumn Detector (Secondary Electrons (SE) with Beam Deceleration)
  • Concentric Backscattered Electron (BSE) detector
  • Retractable STEM detector with Bright Field (BF)/ Dark Field (DF)/High Angle Annular Dark Field (HAADF) segments
  • Oxford X-MaxN Silicon Drift Energy Dispersive X-Ray (EDX) detector
  • Oxford Electron Backscatter Diffraction (EBSD) detector
  • Gatan Electron Beam Induced Current (EBIC) detector
  • Low Vacuum secondary electron detector
  • Gaseous Secondary Electron detector
  • Plasma cleaner for sample and chamber cleaning
  • Exclusive Cryo solution for Dualbeam
  • Ga Injection System (GIS) needle: Pt and Carbon deposition
  • In situ Sample Lift out system
  • Integrated fast beam blanker
  • AutoSlice and View (Automated sequential mill and view for 3D reconstruction)
  • EBS3 (Automated sequential mill and acquire EBSD maps and/or orientation maps)
  • EDS3 (Automated sequential mill and acquire EDS data of chemical maps)
  • Maps (Navigation and photomontage)
  • Platinum and Carbon Deposition
  • EasyLift Needle for micromanipulation (e.g. collection of TEM lamella)
  • Hot and Peltier ( e.g. cold stage) Stages 
  • Standard 5-axes motorized stage 
  • IR Camera for Viewing sample/column
  • Chamber integrated Nav-Cam

Workstation and Support Station Specifications

Workstation for microscope control and acquisition

  • Intel Xeon CPU W 3550 processor
  • 12GB RAM
  • AMD FirePro V3900 graphics card
  • two-1TB SATA HDD RAID
  • Windows 7 64 bit 

Workstation for EDS and EBSD acquisition

  • Intel Core i7-3770, 8GB RAM
  • Intel HD Graphics 4000 graphics card
  • two-512GB SATA HDD
  • Windows 7 64 bit 

Support Station

  • Intel Xeon E5-1620 processor
  • 8GB RAM
  • NVIDIA Quadro 600
  • one-256GB SATA HDD
  • one-2TB SATA HDD
  • Windows 10 64 bit.
Please contact Dr. Prem S. Thapa Chetri (Senior Electron Microscopist) or Dr. Eduardo Rosa-Molinar (Director/Professor) if you need further details.

 


Dr. Prem S. Thapa Chetri

Senior Electron Microscopist 

Questions?

Dr. Eduardo Rosa-Molinar
Director/Professor
erm@ku.edu

Announcements

In observance of the Thanksgiving Holiday, the MAI will be closed Wednesday, November 27th-Friday, November 29th

We will reopen on Monday, December 2nd at 8:30 am. 

We wish you a safe and happy holiday.