Research Resource Core Laboratory

FEI Tecnai F20 XT Transmission Electron Microscope


FEI Tecnai F20 XT Transmission Electron Microscope

Haworth Hall Room 1043E


  • 200kV Field Emission Scanning/Transmission Electron Microscopy (FE S/TEM) electron source
  • Resolution of 0.25nm with TEM and 0.18nm with S/TEM
  • High Tension Voltage adjustable to 20,40,80,120,160 and 200kV
  • (± 60˚) Electron Tomography
  • Choice of 4 sample holders: Single-Tilt, Double-Tilt, Tomography, and Cryo
  • Electron Dispersive X-Ray Spectroscopy (EDS)
  • High Angular Annular Dark Field (HAADF) Detector for S/TEM imaging
  • SiLi EDAX detector (spectral Maps)
  • Selected Area Electron Diffraction
  • Precision Electron Diffraction (Phase mapping)
  • Cryo EM with Lose Dose Collection
  • Automated Tomography Collection
  • Automated Montage Collection
  • Tecnai Imaging and analysis (TIA) tool
  • Digital Micrograph Imaging tool

Workstation and Support Station Specifications 


  • Intel Pentium 4 processor
  • 4GB RAM
  • ATI Radeon X300/X550/X1050 graphics card
  • two-256GB SSD RAID
  • one-256GB SATA HDD
  • Windows XP SP2 32 bit.

Support Station

  • Intel Xeon W3530 processor
  • NVIDIA Quadro 600 graphics card
  • one-256GB SATA HDD
  • one- 1TB SATA HDD,
  • Windows 10 64 bit
Please contact Dr. Prem S. Thapa Chetri (Senior Electron Microscopist) or Dr. Eduardo Rosa-Molinar (Director/Professor) if you need further details.

Dr. Prem S. Thapa Chetri

Senior Electron Microscopist 


Dr. Eduardo Rosa-Molinar


In observance of the Thanksgiving Holiday, the MAI will be closed Wednesday, November 27th-Friday, November 29th

We will reopen on Monday, December 2nd at 8:30 am. 

We wish you a safe and happy holiday.