Lateral Mode

 
Lateral Force Microscopy (LFM) is a secondary contact AFM mode that detects and maps relative differences in the frictional force between the probe tip and the sample surface.  In LFM, the scanning is always perpendicular to the long axis of the cantilever.  Forces on the cantilever that are parallel to the plane of the sample surface cause twisting of the cantilever around its long axis.  This twisting is measured by a quad-cell Position Sensitive PhotoDetector.
lateral mode

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