Force Modulation Mode (Compliance)

Force Modulation imaging is a secondary imaging mode derived from contact ADM that measures relative elasticity/stiffness of surface features, and is commonly used to map the distribution of materials of composite systems. As with LFM and MFM, Force Modulation imaging allows simultaneous acquisition of both topographic and material-property maps.

In Force Modulation imaging mode, the probe tip tracks the sample topography as in normal contact AFM. In addition, a periodic signal mechanically drives the cantilever(and tip) in the Z-direction. The amplitude of the cantilever modulation that results from this applied signal varies according to the elastic properties of the sample.
force modulation

force modulation


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