FEI Tecnai F20 XT Field Emission Transmission Electron Microscope

200kV Electron Source - Schottky field emitter
With high tension values of 20, 40, 80, 120, 160, and 200 kV

Resolution
0.25 nm TEM point resolution with a magnification range of 22 x - 930 kx
0.18 nm STEM HAADF resolution with a magnification range of 150 x - 230 Mx

Multiple Samples Holders - Eucentric Specimen Stage with XYZ, a and ß control
Single-Tilt (alpha)
Double-Tilt (alpha and beta)
Tomography holder with +/- 80˚ maximum title angle
Cryo Holder

Techniques

  • STEM Imaging in both Bright field and Annular Dark Field modes
  • Energy Dispersive X-Ray Spectoscopy for Microanalysis and mapping​
  • Electron Diffraction​
  • Tomography​
  • 3D precession electron diffraction tomography- The limitations of X-Ray diffraction  with nanostructures of nm size level can be solved by the application of the precession electron diffraction  technique by increasing the kinematical character of the electron diffraction.​

TIA is now available offline, please see a member of MAI Staff for access.

Images and data saved in TIA’s propriety format (.emi) can be open without the TIA software using an ImageJ plugin.

FEI Tecnai F20 XT Field Emission Transmission Electron Microscope


 


FEI image example


FEI image example


CONTACT

MAI Lab
Room 1043, Haworth Hall
phone785-864-4380
emailmailab@ku.edu

FAQ's

Instrument Reservations Site

FEE SCHEDULE

fees schedule link

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