FEI Tecnai F20 XT Field Emission Transmission Electron Microscope
200kV Electron Source - Schottky field emitter
With high tension values of 20, 40, 80, 120, 160, and 200 kV
0.25 nm TEM point resolution with a magnification range of 22 x - 930 kx
0.18 nm STEM HAADF resolution with a magnification range of 150 x - 230 Mx
Multiple Samples Holders - Eucentric Specimen Stage with XYZ, a and ß control
Double-Tilt (alpha and beta)
Tomography holder with +/- 80˚ maximum title angle
- STEM Imaging in both Bright field and Annular Dark Field modes
- Energy Dispersive X-Ray Spectoscopy for Microanalysis and mapping
- Electron Diffraction
- 3D precession electron diffraction tomography- The limitations of X-Ray diffraction with nanostructures of nm size level can be solved by the application of the precession electron diffraction technique by increasing the kinematical character of the electron diffraction.
TIA is now available offline, please see a member of MAI Staff for access.
Images and data saved in TIA’s propriety format (.emi) can be open without the TIA software using an ImageJ plugin.