Electrostatic Force Mode

 
Electric Force Microscopy (EFM) is a secondary imaging mode derived from tapping mode that measures electric field gradient distribution above the sample surface. This is performed through lift mode. In EFM, a voltage may be applied between the tip and the sample. The cantilever’s resonance frequency and phase change with the strength of the electric field gradient and are used to construct the EFM image. For example, locally charged domains on the sample surface are mapped in a way that is similar to how MFM maps magnetic domains.
electrostatic force mode

 

CONTACT

MAI Lab
Room 1043, Haworth Hall
phone785-864-4380
emailmailab@ku.edu

FAQ's

Instrument Reservations Site

FEE SCHEDULE

fees schedule link

KU Today
One of 34 U.S. public institutions in the prestigious Association of American Universities
44 nationally ranked graduate programs.
—U.S. News & World Report
Top 50 nationwide for size of library collection.
—ALA
23rd nationwide for service to veterans —"Best for Vets," Military Times